VMworld 2017 Registration Is Open: Here’s What EUC Experts Can Expect

This post was originally published on this site

Registration is open for VMworld 2017. For VMware EUC customers and experts, this is a once-in-a-lifetime experience you won’t want to miss.

Experience End-User Computing (EUC) at VMworld

Date: Aug. 27-31
Location: Las Vegas | Mandalay Bay Hotel & Convention Center

Get connected with EUC subject-matter experts, thought leaders and IT pros at VMworld 2017. You will immerse yourself in the latest technologies, including sneak peeks and hands-on labs of the latest VMware mobility and digital workspace solutions.

Register today to accelerate your digital transformation and drive business innovation across your team with new ideas, solutions and hands-on experiences at VMworld.

Register Today VMworld 2017

What VMworld Holds for EUC Experts

VMworld 2017 promises a once-in-a-lifetime experience for EUC experts to connect with each other and our mobility experts one on one. You’ll also have exciting opportunities to hear from VMware EUC leaders transforming the digital workspace, including Sumit Dhawan, Blake Brannon, Noah Wasmer and so many more.

  • Top-rated EUC breakout sessions and expert panels
  • Opportunities to connect with EUC executives and the VMware ecosystem
  • Hands-on experiences with expert-guided labs and VMware certifications
  • Network with industry peers at exclusive EUC receptions and social events

VMworld 2017 early bird pricingDon’t wait to register for the largest VMware event of the year, and discover the technology, trends and people who, like you, are shaping digital business’ future.

Register with Early Bird Pricing

Take advantage of early-bird pricing and save up to $500 registration. Click here to learn more!

Didn’t make last year’s big event? Here’s what you missed:

The post VMworld 2017 Registration Is Open: Here’s What EUC Experts Can Expect appeared first on VMware End-User Computing Blog.

Leave a Reply

Your email address will not be published. Required fields are marked *